Automated inspection of incomplete grains in multiple grains
Learning of Grain Granules and Feature Data with a Scale of Over 100 Million
Product execution standards: T/CCOA 53-2023 LS/T 6402-2017
Product patents (partial):
● “DOUBLE-SIDED SYNCHRONOUS SCANNING DEVICE AND DOUBLE-SIDED SYNCHRONOUSSCANNER ”
(US PCT Patent) [Patent Number: US17/483147】
● Training method and device for volume estimation model, as well as volume estimation method and device "[Patent No. 202210025201.1]
● Method, device, equipment, and storage medium for estimating grain quality "[Patent No. 202210025872.8]
● Method, device, equipment, and storage medium for detecting chalky areas in rice "[Patent No. 202210025286.3]
● Method, device, computer-readable medium, and computer equipment for detecting abnormal grains "[Patent No. 202310615710.4]
● "Grain Quality Analyzer" [Patent No. 202230195768.4]
At present, in the task of detecting grain quality indicators in China, incomplete grain detection mainly relies on manual detection, with strong subjectivity and low detection efficiency in the detection results. In response to the pain point issue of incomplete grain testing in the industry, the company has developed and launched a series of grain quality analyzer products. This product is equipped with a wheat incomplete grain detection algorithm based on deep learning and machine vision technology, achieving automated and rapid detection of incomplete grain, and deeply promoting the practical application of artificial intelligence technology in the field of grain quality inspection.
Widely used in grain storage, grain processing, grain trade, inspection institutions, scientific research universities, etc
Widely used in grain storage, grain processing, grain trade, inspection institutions, scientific research universities, etc